Join our upcoming webinar on Tuesday Dec. 3rd & Thursday Dec. 5th to explore the application of Dynamic SIMS on thin film analysis!
Our speaker, Joseph Scola, has over 20 years of experience in the field of complex oxides. He will be introducing a D-SIMS analysis investigating matrix effects in a Ba1-xSrxTiO3 thin film (~250 nm) grown by combinatorial PLD on a LaNiSrO4/SrTiO3 stack.
Key learnings will include:
• How the Ti signal varies with Ba-to-Sr substitution, driven by changes in atomic electronegativity.
• The complexity of the sample leads to mass interferences, and the methods used to identify and simulate these interferences.
• In-depth resolution and interface analysis using AFM and TEM, revealing insights into atomic mixing and roughness at the interfaces.
This webinar is ideal for those interested in complex oxides, thin film analysis, and high-resolution materials characterization. Don't miss the opportunity to deepen your understanding of D-SIMS applications and get your questions answered in the Q&A!
Register for the webinar session that best fit your timezone:
REGISTER - Dec. 3, 9AM CET
REGISTER - Dec. 5, 8PM CET
About the Speaker
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Dr. Joseph Scola is a physicist with over 20 years of experience in the field of complex oxides. He earned his Ph.D. in Condensed Matter Physics from the University of Caen after graduating both in applied Mathematics from INSA-Rouen and in Electronics from the University of Rouen, France. Since 2007, he has been working as a professor assistant at University of Paris-Saclay/UVSQ, leading research on electric measurements, atomic force and piezoresponse force microscopy and secondary ion mas spectrometry at GEMaC laboratory UMR 8635 of the CNRS. |