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Off-the-Shelf finFET Device Characterization by APT - Application Note

Tuesday, November 19, 2024 2 days ago

Recent analysis of Snapdragon X70 finFET devices highlights Atom Probe Tomography's ability to uncover nanoscale dopant clustering in SiGe source/drain regions. These findings provide critical insights into performance-impacting phenomena, advancing semiconductor R&D for next-generation devices.
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Webinar - SIMS analysis of an oxide thin film with continuous composition gradient

Friday, November 15, 2024 6 days ago

Join our upcoming webinar to explore the application of Dynamic SIMS on thin film analysis!
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Webinar - Secondary Ion Mass Spectrometry Measurements with a Large Scale-to-Resolution Ratio

Friday, November 8, 2024 13 days ago

Join us on Thursday, November 28th for our new webinar and find out what is the deepest SIMS depth profile ever registered!
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Webinar - Isotopic and elemental characterization of nuclear and radioactive materials at the micrometric scale

Tuesday, October 29, 2024 23 days ago

Join us on Tuesday, November 19th for a webinar focusing on the use of SIMS for nuclear and radioactive materials!
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10èmes Journées du Réseau SIMS Francophone (RSF) | CAMECA

Friday, October 18, 2024 34 days ago

CAMECA a le plaisir d'inviter tous les utilisateurs francophones de nos instruments SIMS à notre siège social cet automne.
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Advancing Oxide Semiconductors with APT - Application Note

Thursday, October 10, 2024 42 days ago

Recent research by Kasper Hunnestad and team NTNU demonstrates Atom Probe Tomography’s ability to map oxygen vacancies in oxide heterostructures. These breakthrough findings enhance our understanding of complex oxides’ electric and magnetic properties and are of significant interest across a wide range of systems.
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New blog: Unveiling the Hidden Threat : Tracking Uranium Accumulation in Marine Mussels with Dynamic SIMS

Friday, September 20, 2024 62 days ago

We are pleased to share our latest blog post: “Unveiling the Hidden Threat: Tracking Uranium Accumulation in Marine Mussels with Dynamic SIMS”.
This post explores the intricate world of radioactive contamination in marine environments.

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Dopant Distribution within SiC Power Devices - Application note

Thursday, August 1, 2024 112 days ago

This study uses Atom Probe Tomography (APT) to analyze aluminum dopant distribution in SiC JFETs, revealing significant dopant clustering and lattice defects from ion implantation.
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11th International NanoSIMS Workshop

Wednesday, July 31, 2024 113 days ago

CAMECA is pleased to host the 11th International NanoSIMS Workshop in October 15-16, 2024. Whether expert or beginner, all NanoSIMS enthousiasts are welcomed!
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Power Electronics: Accurate characterization of Si-doped β-Ga2O3 epitaxial films - Application Note

Wednesday, July 31, 2024 113 days ago

Researchers achieved continuous silicon doping in β-Ga2O3 epitaxial films, crucial for power electronics, using D-SIMS to ensure precise doping control and stability at high temperatures.
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CAMECA at Goldschmidt 2024: booth 17

Tuesday, July 30, 2024 114 days ago

Join us at Goldschmidt 2024, CAMECA booth #17, for a special happy hour on August 20 at 4 pm, featuring presentations by Pierre Haenecour on NASA's OSIRIS-REx mission and Elias Bloch, showcasing the latest NanoSIMS-HR advancements.
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CAMECA at SIMS 24, the International Conference on Secondary Ion Mass Spectrometry. Join us!

Tuesday, July 30, 2024 114 days ago

Mark your agenda and attend CAMECA presentations and dinner party at the International Conference on Secondary Ion Mass Spectrometry.

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D-SIMS Analysis of Electrochemical Sensors - Application Note

Monday, July 1, 2024 143 days ago

Scientists tested an indium tin oxide (ITO) electrode in a yttria-stabilized zirconia (YSZ) oxygen sensor, demonstrating stable performance at low temperatures and using D-SIMS to analyze ion diffusion, which provided key insights for sensor optimization.
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Unraveling the Cr Isotopes of Ryugu with Large-Geometry Secondary Ion Mass Spectrometry - Application Note

Thursday, May 30, 2024 175 days ago

A recent study leverages Large-Geometry Secondary Ion Mass Spectrometry (LG-SIMS) to analyze the chromium isotopic composition of Ryugu asteroid samples returned by JAXA’s Hayabusa2 mission.
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Webinar - Revealing the intracellular distributions of biomolecules with a novel NanoSIMS-based methodology

Tuesday, May 14, 2024 191 days ago

Explore with Melanie Brunet, the intracellular distributions of biomolecules with a novel NanoSIMS-based methodology
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Webinar - Enhanced Characterization of Very Deep Proton Implants with Dynamic SIMS

Friday, May 3, 2024 202 days ago

Explore the superior capabilities of Dynamic SIMS for analyzing low-dose deep proton implants in industrially relevant silicon.
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Atom Probe Tomography Users Conference June 17 – 20 in Madison, USA

Wednesday, May 1, 2024 204 days ago

Join us for the 2024 Atom Probe Tomography Users Conference June 17 – 20 in Madison, Wisconsin, USA
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📢 CAMECA Blog, dive into expertise

Tuesday, April 30, 2024 205 days ago

Our new Blog was just launched! Our APT, SIMS and EPMA experts are delighted to share insights into industry trends, application developments, and more!
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Monitoring of etching processes in a High Volume Manufacturing environment with AKONIS SIMS

Tuesday, April 23, 2024 212 days ago

Imec's innovative forksheet devices push nanosheet architecture boundaries; AKONIS SIMS tool offers superior sensitivity for accurate analysis of etching processes in these complex 3D structures.
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Investigating Magnesium Diffusion in GaN with Dynamic SIMS - Application note

Friday, March 29, 2024 237 days ago

Adequate ion implantation is key to obtain best performing GaN devices. Depth profiling with D-SIMS unables to investigate deep specie diffusion behavior within the implanted layer.
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Introducing the NanoSIMS-HR: The next frontier in nanoanalysis for science & high tech

Friday, March 8, 2024 258 days ago

CAMECA is delighted to launch the NanoSIMS-HR, successor of the world-acclaimed NanoSIMS 50/50L Secondary Ion Mass Spectrometer series which have contributed to major advances in the most diverse fields of fundamental research and industrial innovation.
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Grain Boundary Analysis in Ni-based Superalloys with APT – Application Note

Tuesday, March 5, 2024 261 days ago

In collaboration with an Australian manufacturer, researchers at UNSW Sydney developed APT methods for the quantitative characterization of segregation and precipitation in Ni-based superalloys.
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Join us for three webinars in celebration of the UN’s International Day of Women & Girls in Science

Friday, February 9, 2024 286 days ago

Meet three passionate scientists: Karen Wright, (INL,USA), Cécile Becquart, (AstraZeneca, Sweden), and Gina Greenidge, NPL, all three addressing key challenges in today’s world.
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APT Measurement of Hydrogen Traps with Room Temperature Transfer - Application note

Tuesday, February 6, 2024 289 days ago

Chalmers University of Technology scientists have recently successfully observed H/D trapping within the microstructure of a high-strength steel using Atom Probe Tomography without cryogenic transfer. A leap forward in hydrogen embrittlement studies!
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Developing atom probe for bone tissue repair medical devices - Application note

Wednesday, January 17, 2024 309 days ago

A research team at the University of Sydney demonstrated the potential of atom probe tomography in studying the integration and element transfer between synthetic bone and surrounding tissue
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News and Events

What's New

{3}

Off-the-Shelf finFET Device Characterization by APT - Application Note

Webinar - SIMS analysis of an oxide thin film with continuous composition gradient

Webinar - Secondary Ion Mass Spectrometry Measurements with a Large Scale-to-Resolution Ratio

Webinar - Isotopic and elemental characterization of nuclear and radioactive materials at the micrometric scale

10èmes Journées du Réseau SIMS Francophone (RSF) | CAMECA

Advancing Oxide Semiconductors with APT - Application Note

New blog: Unveiling the Hidden Threat : Tracking Uranium Accumulation in Marine Mussels with Dynamic SIMS

Dopant Distribution within SiC Power Devices - Application note

11th International NanoSIMS Workshop

Power Electronics: Accurate characterization of Si-doped β-Ga2O3 epitaxial films - Application Note

CAMECA at Goldschmidt 2024: booth 17

CAMECA at SIMS 24, the International Conference on Secondary Ion Mass Spectrometry. Join us!

D-SIMS Analysis of Electrochemical Sensors - Application Note

Unraveling the Cr Isotopes of Ryugu with Large-Geometry Secondary Ion Mass Spectrometry - Application Note

Webinar - Revealing the intracellular distributions of biomolecules with a novel NanoSIMS-based methodology

Webinar - Enhanced Characterization of Very Deep Proton Implants with Dynamic SIMS

Atom Probe Tomography Users Conference June 17 – 20 in Madison, USA

📢 CAMECA Blog, dive into expertise

Monitoring of etching processes in a High Volume Manufacturing environment with AKONIS SIMS

Investigating Magnesium Diffusion in GaN with Dynamic SIMS - Application note

Introducing the NanoSIMS-HR: The next frontier in nanoanalysis for science & high tech

Grain Boundary Analysis in Ni-based Superalloys with APT – Application Note

Join us for three webinars in celebration of the UN’s International Day of Women & Girls in Science

APT Measurement of Hydrogen Traps with Room Temperature Transfer - Application note

Developing atom probe for bone tissue repair medical devices - Application note