SIMS & NanoSIMS

• Materials
• Geosciences
• Nuclears

• Stable isotopes
• Geochronology
• Trace elements
• Nuclear forensics

You are welcome to send us any missing references, pdf and supplements!
Please email cameca.info@ametek.com.

Impact of surface reflectivity on the ultra-fast laser melting of silicon-germanium alloys. Damiano Ricciarelli, Giovanni Mannino, Ioannis Deretzis, Gaetano Calogero, Giuseppe Fisicaro, Richard Daubriac, Fuccio Cristiano, Remi Demoulin, Paweł Piotr Michałowski, Pablo Acosta-Alba, Jean-Michel Hartmann, Sébastien Kerdilès, Antonino La Magna
Materials Science in Semiconductor Processing 165, 107635 (2023)
Read the full article

From DFT investigations of oxygen-implanted molybdenum disulfide to temperature-induced stabilization of MoS2/MoO3 heterostructure. Sylwia Kozdra, Adrianna Wójcik, Tamal Das, Paweł Piotr Michałowski
Applied Surface Science 631, 157547 (2023)
Read the full article

Insights into the physical and chemical properties of struvite crystal surfaces in terms of the effectiveness of bacterial adhesion. Jolanta Prywer, Agnieszka Torzewska, Michał Cichomski, Paweł Piotr Michałowski
Scientific Reports 13, 5557 (2023)
Read the full article

Secondary ion mass spectrometry quantification of boron distribution in an array of silicon nanowires. Paweł Piotr Michałowski, Jonas Müller, Chiara Rossi, Alexander Burenkov, Eberhard Bär, Guilhem Larrieu, Peter Pichler
Measurement 211, 112630 (2023)
Read the full article

Multi-technique characterisation of InAs-on-GaAs wafers with circular defect pattern. Jacek Boguski, Jarosław Wróbel, Sebastian Czesław Złotnik, Bogusław Mirosław Budner, Malwina Liszewska, Łukasz Kubiszyn, Paweł Piotr Michałowski, Łukasz Ciura, Paweł Jerzy Moszczyński, Sebastian Odrzywolski, Bartłomiej Jerzy Jankiewicz, Jerzy Wróbel
Opto-Electronics Review 31, e144564 (2023)
Read the full article

Oxycarbide MXenes and MAX phases identification using monoatomic layer-by-layer analysis with ultralow-energy secondary-ion mass spectrometry. Paweł Piotr Michałowski, Mark Anayee, Tyler S Mathis, Sylwia Kozdra, Adrianna Wójcik, Kanit Hantanasirisakul, Iwona Jóźwik, Anna Piątkowska, Małgorzata Możdżonek, Agnieszka Malinowska, Ryszard Diduszko, Edyta Wierzbicka, Yury Gogotsi
Nature Nanotechnology 17, 1192-1197 (2022)
Read the full article

Poly (vinylidene fluoride) solid polymer electrolyte structure revealed by secondary ion mass spectrometry. Sylwia Kozdra, Adrianna Wójcik, Małogrzata Możdżonek, Łukasz Florczak, Ireneusz Opaliński, Paweł Piotr Michałowski
Polymer 259, 125364 (2022)
Read the full article

Empirical indication for desalinating properties of porous boron nitride. Adrianna Wójcik, Aleksandra K. Dąbrowska, Sylwia Kozdra, Johannes Binder, Włodzimierz Strupiński, Roman Stępniewski, Andrzej Wysmołek, Tomasz Strachowski, Marek Wzorek, Agnieszka Malinowska, Edyta Wierzbicka, Ryszard Diduszko, Paweł Piotr Michałowski
Scripta Materialia 220, 114943 (2022)
Read the full article

Photoelectric, optical and microstructural characterization of thin palladium silicide (Pd2Si) layers fabricated by magnetron sputtering from a stoichiometric target. Krzysztof Piskorski, Marek Wzorek, Marek Ekielski, Lech Dobrzański, Jarosław Gaca, Agnieszka Malinowska, Paweł Piotr Michałowski, Michał A Borysiewicz
Materials Science and Engineering: B 283, 115831 (2022)

Thermal oxidation of [0001] GaN in water vapor compared with dry and wet oxidation: Oxide properties and impact on GaN. Łukasz Janicki, Ryszard Korbutowicz, Mariusz Rudziński, Paweł Piotr Michałowski, Sebastian Złotnik, Miłosz Grodzicki, Sandeep Gorantla, Jarosław Serafińczuk, Detlef Hommel, Robert Kudrawiec
Applied Surface Science 598, 153872 (2022)
Read the full article

Diazonium-Based Covalent Molecular Wiring of Single-Layer Graphene Leads to Enhanced Unidirectional Photocurrent Generation through the p‑doping Effect. Margot Jacquet, Silvio Osella, Ersan Harputlu, Barbara Pałys, Monika Kaczmarek, Ewa K. Nawrocka, Adam A. Rajkiewicz, Marcin Kalek, Paweł Piotr Michałowski, Bartosz Trzaskowski, C. Gokhan Unlu, Wojciech Lisowski, Marcin Pisarek, Krzysztof Kazimierczuk, Kasim Ocakoglu, Agnieszka Więckowska, Joanna Kargul
Chemistry of Materials 34, 3744-3758 (2022)
Read the full article

Contamination-induced inhomogeneity of noise sources distribution in Al2O3-passivated quasi-free-standing graphene on 4H-SiC (0001). Tymoteusz Ciuk, Paweł Piotr Michałowski, Jakub Jagiełło, Artur Dobrowolski, Karolina Piętak, Damian Kalita, Marek Wzorek, Rafał Budzich, Dariusz Czołak, Andrzej Kolek
Physica E: Low-dimensional Systems and Nanostructures 142, 115264 (2022)
Read the full article

Precise localization of contaminants in graphene with secondary ion mass spectrometry. Paweł Piotr Michałowski, Sylwia Kozdra, Iwona Pasternak, Jakub Sitek, Adrianna Wójcik, Włodek Strupiński. Measurement 187, 110308 (2022)
Read the full article

Mechanisms of Ohmic Contact Formation of Ti/Al-Based Metal Stacks on p-Doped 4H-SiC. Matthias Kocher, Mathias Rommel, Paweł Piotr Michałowski, Tobias Erlbacher
Materials 15, 50 (2022)
Read the full article

Insight into structure-property relationship of organometallic terpyridine wires: Combined theoretical and experimental study. Sylwia Kozdra, Margot Jacquet, Joanna Kargul, Karol Hęclik, Adrianna Wójcik, Paweł Piotr Michałowski. Polyhedron 213, 115628 (2022)
Read the full article

Development of Quaternary InAlGaN Barrier Layer for High Electron Mobility Transistor Structures. Justinas Jorudas, Paweł Prystawko, Artur Šimukovic, Ramunas Aleksiejunas, Juras Mickevicius, Marcin Kryśko, Paweł Piotr Michałowski, Irmantas Kašalynas. Materials 15, 1118 (2022)
Read the full article

Insights on boron impact on structural characteristics in epitaxially grown BGaN. Ewelina B. Możdżyńska, Sebastian Złotnik, Paweł Ciepielewski, Jarosław Gaca, Marek Wójcik, Paweł P. Michałowski, Krzysztof Rosiński, Karolina Piętak, Mariusz Rudziński, Elżbieta Jezierska, Jacek M. Baranowski. Journal of Materials Science volume 57, 7265 (2022)
Read the full article

Magnetic damping in ferromagnetic/heavy-metal systems: The role of interfaces and the relation to proximity-induced magnetism. C. Swindells, H. Głowiński, Y. Choi, D. Haskel, P. P. Michałowski, T. Hase, F. Stobiecki, P. Kuświk, D. Atkinson. Physical Review B 105, 094433 (2022)
Read the full article

Three-step, transfer-free growth of MoS2/WS2/graphene vertical van der Waals heterostructure. Jakub Sitek, Iwona Pasternak, Karolina Czerniak-Łosiewicz, Michał Świniarski, Paweł P Michałowski, Clifford McAleese, Xiaochen Wang, Ben R Conran, Konrad Wilczyński, Michał Macha, Aleksandra Radenović, Mariusz Zdrojek, Włodek Strupiński. 2D Materials 9, 025030 (2022)
Read the full article

Titanium Nitride as a Plasmonic Material from Near-Ultraviolet to Very-Long-Wavelength Infrared Range. Jarosław Judek, Piotr Wróbel, Paweł Piotr Michałowski, Monika Ożga, Bartłomiej Witkowski, Aleksandra Seweryn, Michał Struzik, Cezariusz Jastrzębski, Krzysztof Zberecki. Materials 14, 7095 (2021)
Read the full article

Proximity-induced magnetism and the enhancement of damping in ferromagnetic/heavy metal systems. C. Swindells, H. Głowiński, Y. Choi, D. Haskel, P.P. Michałowski, T. Hase, P. Kuświk, D. Atkinson. Applied Physics Letters 119, 152401 (2021)
Read the full article

Development of a universal conductive platform for anchoring photo- and electroactive proteins using organometallic terpyridine molecular wires. Margot Jacquet, Miriam Izzo, Silvio Osella, Sylwia Kozdra, Paweł P. Michałowski, Dariusz Gołowicz, Krzysztof Kazimierczuk, Maciej T. Gorzkowski, Adam Lewera, Marian Teodorczyk, Bartosz Trzaskowski, Rafał Jurczakowski, Daniel T. Gryko, Joanna Kargul. Nanoscale 13, 9773 (2021)
Read the full article

Defect-mediated sputtering process of boron nitride during high incident angle low-energy ion bombardment. Paweł Piotr Michałowski, Dawid Maciążek, Zbigniew Postawa, Piotr A Caban, Sylwia Kozdra, Adrianna Wójcik, Jacek M Baranowski. Measurement 179, 109487 (2021)
Read the full article

Highly-doped p-type few-layer graphene on UID off-axis homoepitaxial 4H-SiC. Tymoteusz Ciuk, Wawrzyniec Kaszub, Kinga Kosciewicz, Artur Dobrowolski, Jakub Jagiello, Adrianna Chamryga, Jaroslaw Gaca, Marek Wojcik, Dariusz Czolak, Beata Stanczyk, Krystyna Przyborowska, Roman Kozlowski, Michal Kozubal, Pawel Piotr Michalowski, Maciej Jan Szary, Pawel Kaminski. Current Applied Physics 27, 17-24 (2021)
Read the full article

Effect of oxidation temperature on the inhomogeneity of chemical composition and density in nanometric SiO2 films grown on 4H-SiC. Paweł Kamiński, Rafał Budzich, Jarosław Gaca, Paweł Piotr Michałowski, Roman Kozłowski, Anna Harmasz, Tymoteusz Ciuk, Janusz Płocharski. Journal of Materials Chemistry C 9, 4393-4404 (2021)
Read the full article

Arsenic‐Induced Growth of Dodecagonal GaN Microrods with Stable a‐Plane Walls. Paulina Ciechanowicz, Sandeep Gorantla, Paweł Piotr Michałowski, Ewelina Zdanowicz, Jean‐Guy Rousset, Daria Hlushchenko, Krzysztof Adamczyk, Dominika Majchrzak, Robert Kudrawiec, Detlef Hommel. Advanced Optical Materials 9, 2001348 (2021)
Read the full article

Selective etching of p-GaN over Al0.25Ga0.75N in Cl2/Ar/O2 ICP plasma for fabrication of normally-off GaN HEMTs. Andrzej Taube, Maciej Kamiński, Marek Ekielski, Renata Kruszka, Joanna Jankowska-Śliwińska, Paweł Piotr Michałowski, Joanna Zdunek, Anna Szerling. Materials Science in Semiconductor Processing 122, 105450 (2021).
Read the full article

Electrically active and hydrogen passivated Zn in GaAs/AlGaAs specifically distinguished during secondary ion mass spectrometry depth profiling. Adrianna Wójcik, Walery Kolkowski, Iwona Pasternak, Włodzimierz Strupiński, Sylwia Kozdra, Paweł Piotr Michałowski. Journal of Analytical Atomic Spectrometry 36, 178–184 (2021).
Read the full article

Two-dimensional electron gas at the AlGaN/GaN interface: Layer thickness dependence. Vladimir N. Popok, Piotr A. Caban, Pawel Piotr Michalowski, Ryan Thorpe, Leonard C. Feldman, and Kjeld Pedersen. Journal of Applied Physics 127, 115703 (2020)
Read the full article

Carbon incorporation in boron nitride grown by MOCVD under N2 flow. P.A. Caban, P.P. Michalowski, I. Wlasny, J. Gaca, M. Wojcik, P. Ciepielewski, D. Teklinska, J.M. Baranowski. Journal of Alloys and Compounds, Volume 815, 152364 (2020)
Read the full article

Next generation low temperature polycrystalline materials for above IC electronics. High mobility n- and p-type III–V metalorganic vapour phase epitaxy thin films on amorphous substrates. Agnieszka Gocalinska, Andrea Pescaglini, Eleonora Secco, Enrica E Mura, Kevin Thomas, Anya Curran, Farzan Gity, Roger Nagle, Michael Schmidt, Paweł Piotr Michałowski, Paul K Hurley, Ian Povey, Emanuele Pelucchi. Journal of Physics: Photonics 2, 025003 (2020).
Read the full article

3D Depth Profile Reconstruction of Segregated Impurities using Secondary Ion Mass Spectrometry. Paweł Piotr Michałowski, Sebastian Zlotnik, Iwona Jóźwik, Adrianna Chamryga, Mariusz Rudziński. Journal of Visualized Experiments 158, e61065 (2020).
Read the full article

Titanium pre-sputtering for an enhanced secondary ion mass spectrometry analysis of atmospheric gas elements. Paweł Piotr Michałowski. Journal of Analytical Atomic Spectrometry 35, 1047 (2020).
Read the full article

Phosphorus implantation of Mg-doped (Al)GaN heterostructures: structural examination and depth profiling. Karolina Piętak, Sebastian Złotnik, Ewelina Rozbiegała, Paweł Piotr Michałowski, Marek Wójcik, Jarosław Gaca, Mariusz Rudziński. Journal of Materials Science: Materials in Electronics 31, 17892–17902 (2020). 
Read the full article

Locally-Strain-Induced Heavy-Hole-Band Splitting Observed in Mobility Spectrum of p-Type InAs Grown on GaAs. Jarosław Wróbel, Gilberto A. Umana-Membreno, Jacek Boguski, Dariusz Sztenkiel, Paweł Piotr Michałowski, Piotr Martyniuk, Lorenzo Faraone, Jerzy Wróbel, Antoni Rogalski. Physica Status Solidi - Rapid Research Letters 14, 1900604 (2020).
Read the full article

Two-dimensional electron gas at the AlGaN/GaN interface: Layer thickness dependence. Vladimir N. Popok, Piotr Caban, Paweł Piotr Michałowski, Ryan Thorpe, Leonard C. Feldman, Kjeld Pedersen. Journal of Applied Physics 127, 115703 (2020).
Read the full article

Influence of Silicon Layers on the Growth of ITO and AZO in Silicon Heterojunction Solar Cells. Alexandros Cruz, Florian Ruske, Alberto Eljarrat, Paweł Piotr Michałowski, Anna B. Morales-Vilches, Sebastian Neubert, Er-Chien Wang, Christoph T. Koch, Bernd Szyszka, Rutger Schlatmann, Bernd Stannowski. IEEE Journal of Photovoltaics 10, 8944078, 703-709 (2020).
Read the full article

Carbon incorporation in boron nitride grown by MOCVD under N2 flow. Piotr Caban, Paweł Piotr Michałowski, Igor Własny, Jarosław Gaca, Marek Wójcik, Paweł Ciepielewski, Dominika Teklińska, Jacek Baranowski. Journal of Alloys and Compounds 815, 152364 (2020).
Read the full article

Magnetic Domains without Domain Walls: A Unique Effect of He+ Ion Bombardment in Ferrimagnetic Tb/Co Films. Łukasz Frąckowiak, Piotr Kuświk, Gabriel David Chaves-O’Flynn, Maciej Urbaniak, Michał Matczak, Paweł Piotr Michałowski, Andrzej Maziewski, Meike Reginka, Arno Ehresmann, Feliks Stobiecki. Physical Review Letters 124, 047203 (2020).
Read the full article

Probing a chemical state during ultra low impact energy secondary ion mass spectrometry depth profiling. Paweł Piotr Michałowski. Journal of Analytical Atomic Spectrometry 34, 1954-1956 (2019).
Read the full article

Growth and thermal annealing for acceptor activation of p-type (Al)GaN epitaxial structures: Technological challenges and risks. Sebastian Złotnik, Jakub Sitek, Krzysztof Rosiński, Paweł Piotr Michałowski, Jarosław Gaca, Marek Wójcik, Mariusz Rudziński. Applied Surface Science 488, 688-695 (2019).
Read the full article

Indium concentration fluctuations in InGaN/GaN quantum wells. Paweł Piotr Michałowski, Ewa Grzanka, Szymon Grzanka, Artur Lachowski, Grzegorz Staszczak, Mike Leszczyński, Andrzej Turos.
Journal of Analytical Atomic Spectrometry 34, 1718-1723 (2019).
https://pubs.rsc.org/en/content/articlelanding/2019/JA/C9JA00122K#!divAbstract

Three dimensional localization of unintentional oxygen impurities in gallium nitride. Paweł Piotr Michałowski, Sebastian Złotnik, Mariusz Rudziński. Chemical Communications 55, 11539-11542 (2019)
https://pubs.rsc.org/en/content/articlelanding/2019/CC/C9CC04707G#!divAbstract

Thermal Conversion of Ethanol into Carbon Nanotube Coatings with Adjusted Packing Density. H. Jagalur Basheer, K. Baba, and N. Bahlawane. ACS Omega (2019), 4, 6, 10405–10410.
Read full article

Growth of highly oriented MoS2 via an intercalation process in the graphene/SiC(0001) system. Paweł Piotr Michałowski, Piotr Knyps, Paweł Ciepielewski, Piotr Caban, Ewa Dumiszewska, Grzegorz Kowalski, Mateusz Tokarczyk, Jacek Baranowski. Physical Chemistry Chemical Physics 21, 20641-20646 (2019).
https://pubs.rsc.org/en/content/articlelanding/2019/CP/C9CP03846A#!divAbstract

Secondary ion mass spectrometry investigation of carbon grain formation in boron nitride epitaxial layers with atomic depth resolution. Paweł Piotr Michałowski,  Piotr Caban  and  Jacek Baranowski. Journal of Analytical Atomic Spectrometry 34, 848-853 (2019).
https://pubs.rsc.org/en/content/articlelanding/2019/ja/c9ja00004f

Destructive role of oxygen in growth of molybdenum disulfide determined by secondary ion mass spectrometry. Paweł Piotr Michałowski, Piotr Knyps, Paweł Ciepielewski, Piotr Caban, Ewa Dumiszewska  and  Jacek Baranowski. Physical Chemistry Chemical Physics 21, 8837-8842 (2019).
https://pubs.rsc.org/en/content/articlelanding/2019/cp/c9cp00613c

Crystallisation Phenomena of In2O3:H Films. Ruslan Muydinov, Alexander Steigert, Markus Wollgarten, Paweł Piotr Michałowski, Ulrike Bloeck, Andreas Pflug, Darja Erfurt, Reiner Klenk, Stefan Körner, Iver Lauermann and Bernd Szyszka. Materials 12, 266 (2019)
https://www.mdpi.com/1996-1944/12/2/266

A passivating contact for silicon solar cells formed during a single firing thermal annealing. Andrea Ingenito, Gizem Nogay, Quentin Jeangros, Esteban Rucavado, Christophe Allebé, Santhana Eswara, Nathalie Valle, Tom Wirtz, Jörg Horzel, Takashi Koida, Monica Morales-Masis, Matthieu Despeisse, Franz-Josef Haug, Philipp Löper & Christophe Ballif. Nature Energy, volume 3, pages800–808 (2018)
https://www.nature.com/articles/s41560-018-0239-4

A-Crater-within-a-Crater Approach for Secondary Ion Mass Spectrometry Evaluation of the Quality of Interfaces of Multilayer Devices. Paweł Piotr Michałowski , Wawrzyniec Kaszub, Piotr Knyps, Krzysztof Rosiński, Beata Stańczyk, Krystyna Przyborowska and Ewa Dumiszewska. ACS Applied Matererials & Interfaces  10, 37694-37698 (2018)
https://pubs.acs.org/doi/10.1021/acsami.8b13062

Oxygen out-diffusion and compositional changes in zinc oxide during ytterbium ions bombardment. Paweł Piotr Michałowski Jarosław Gaca Marek Wójcik Andrzej Turos. Nanotechnology 29, 425710 (2018)
http://iopscience.iop.org/article/10.1088/1361-6528/aad881

Thermally activated double-carrier transport in epitaxial graphene on vanadium-compensated 6H-SiC as revealed by Hall effect measurements. Tymoteusz Ciuk, Andrzej Kozlowski, Paweł Piotr Michałowski, Wawrzyniec Kaszub, Michal Kozubal, Zbigniew Rekuc, Jaroslaw Podgorski, Beata Stanczyk, Krystyna Przyborowska, Iwona Jozwik, Andrzej Kowalik, Pawel Kaminski. Carbon 139, 776-781 (2018)
https://www.sciencedirect.com/science/article/pii/S0008622318306973

The role of hydrogen in carbon incorporation and surface roughness of MOCVD-grown thin boron nitride. Piotr A. Caban, Dominika Teklinska, Paweł P. Michałowski, Jaroslaw Gaca, Marek Wojcik, Justyna Grzonka, Pawel Ciepielewski, Malgorzata Mozdzonek, Jacek M. Baranowski. Journal of Crystal Growth 498, 71-76 (2018)
https://www.sciencedirect.com/science/article/pii/S0022024818302756

Oxygen-induced high diffusion rate of magnesium dopants in GaN/AlGaN based UV LED heterostructures. Paweł Piotr Michałowski, Sebastian Złotnik, Jakub Sitek, Krzysztof Rosińskia and Mariusz Rudzińskia. Physical Chemistry Chemical Physics 20, 13890-13895 (2018)
http://pubs.rsc.org/en/Content/ArticleLanding/2018/CP/C8CP01470A

Self-organized multi-layered graphene–boron-doped diamond hybrid nanowalls for high-performance electron emission devices. Kamatchi Jothiramalingam Sankaran, Mateusz Ficek, Srinivasu Kunuku, Kalpataru Panda, Chien-Jui Yeh, Jeong Young Park, Miroslaw Sawczak, Paweł Piotr Michałowski, Keh-Chyang Leou, Robert Bogdanowicz, I-Nan Lin and Ken Haenen. Nanoscale 10, 1345-1355 (2018)
http://pubs.rsc.org/en/content/articlelanding/2018/nr/c7nr06774g

Formation of a highly doped ultra-thin amorphous carbon layer by ion bombardment of Graphene. Paweł Piotr Michałowski, Iwona Pasternak, Paweł Ciepielewski, Francisco Guinea and Włodek Strupiński. Nanotechnology 29, 305302 (2018)
http://iopscience.iop.org/article/10.1088/1361-6528/aac307

Contamination-free Ge-based graphene as revealed by graphene enhanced secondary ion mass spectrometry (GESIMS). Paweł Piotr Michałowski, Iwona Pasternak and Włodek Strupiński. Nanotechnology 29, 015702 (2018).
http://iopscience.iop.org/article/10.1088/1361-6528/aa98ed

Sodium enhances indium-gallium interdiffusion in copper indium gallium diselenide photovoltaic absorbers. D. Colombara, F. Werner, T. Schwarz, I. Cañero Infante, Y. Fleming, N. Valle, C. Spindler, E. Vacchieri, G. Rey, M. Guennou, M. Bouttemy, A. Garzón Manjón, I. Peral Alonso, M. Melchiorre, B. El Adib, B. Gault, D. Raabe, Phillip J. Dale & S. Siebentritt. Nature Communications volume 9, Article number: 826 (2018). Read full article

Influence of hydrogen intercalation on graphene/Ge(0 0 1)/Si(0 0 1) interface. Justyna Grzonka, Iw ona Pasternak, Paweł Piotr Michałowski, Valery Kolkovsky and Włodek Strupiński. Applied Surface Science 447, 582-586 (2018).
https://www.sciencedirect.com/science/article/pii/S0169433218309838

Characterization of the superlattice region of a quantum cascade laser by secondary ion mass spectrometry. Paweł Piotr Michałowski, Piotr Gutowski, Dorota Pierścińska, Kamil Pierściński, Maciej Bugajski and  Włodek Strupińskiac. Nanoscale 9, 17571-17575 (2017).
http://pubs.rsc.org/en/Content/ArticleLanding/2017/NR/C7NR06401B

Facet‐Independent Electric‐Field‐Induced Volume Metallization of Tungsten Trioxide Films. S. G. Altendorf, J. Jeong, D. Passarello, N. B. Aetukuri, M. G. Samant, Stuart S. P. Parkin. Advanced Materials, Volume28, Issue26, July 13, (2016), Pages 5284-5292. Read full article

Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS). Paweł Piotr Michałowski, Wawrzyniec Kaszub, Iwona Pasternak and Włodek Strupiński. Scientific Reports 7, 7479 (2017).
https://www.nature.com/articles/s41598-017-07984-1

Reproducibility of implanted dosage measurement with CAMECA Wf. Kian Kok Ong, Yun Wang and Zhiqiang Mo. IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (2017).
DOI: 10.1109/IPFA.2017.8060158

Investigation of Cs+ bombardment effects in ultra-thin oxynitride gate dielectrics characterization by DSIMS. Yun Wang, Kian Kok Ong, Zhi Qiang Mo, Han Wei Teo, Si Ping Zhao. IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (2017).
DOI: 10.1109/IPFA.2017.8060216

Secondary ion mass spectroscopy depth profiling of hydrogen-intercalated graphene on SiC. Pawel Piotr Michalowski, Wawrzyniec Kaszub, Alexandre Merkulov and Wlodek Strupinski. Appl. Phys. Lett. 109, 011904 (2016).
http://scitation.aip.org/content/aip/journal/apl/109/1/10.1063/1.4958144

SIMS depth profiling and topography studies of repetitive III–V trenches under low energy oxygen ion beam sputtering. Viktoriia Gorbenko, Franck Bassani, Alexandre Merkulov, Thierry Baron, Mickael Martin, Sylvain David and Jean-Paul Barnes. J. Vac. Sci. Technol. B 34, 03H131 (2016).
http://dx.doi.org/10.1116/1.4944632 

Kr implantation into heavy ion irradiated monolithic UeMo/Al systems: SIMS and SEM investigations. T. Zweifel, N. Valle, C. Grygiel, I. Monnet, L. Beck, W. Petry (2016), Journal of Nuclear Materials, Volume 470, Pages 251-257. doi:10.1016/j.jnucmat. 2015.12.039.

Investigation of the depth‐profiling capabilities of the Storing Matter technique. B. Kasel T. Wirtz. Journal of mass spectrometry (2015). Read full article

Organo-Chlorinated Thin Films Deposited by Atmospheric Pressure Plasma-Enhanced Chemical Vapor Deposition for Adhesion Enhancement between Rubber and Zinc-Plated Steel Monofilaments. C. Vandenabeele, S. Bulou, R. Maurau, F. Siffer, T. Belmonte and P. Choquet. ACS Appl. Mater. Interfaces (2015), 7, 26, 14317–14327. Read full article

Ion beam characterizations of plasma immersion ion implants for advanced nanoelectronic applications. M. Veillerot, F. Mazen, N. Payen, J.P. Barnes, F. Pierre (2014), SIMS Europe 2014, September 7-9, 2014.

Temperature-Dependent Wear Mechanisms for Magnetron-Sputtered AlTiTaN Hard Coatings. V. Khetan, N. Valle, D. Duday, C. Michotte, C. Mitterer, M-P Delplancke-Ogletree, and P. Choquet. ACS Appl. Mater. Interfaces (2014), 6, 17, 15403–15411. Read full article

Characterization of arsenic PIII implants in FinFETs by LEXES, SIMS and STEM-EDX. Kim-Anh Bui-Thi Meura, Frank Torregrosa, Anne-Sophie Robbes, Seoyoun Choi, Alexandre Merkulov, Mona P. Moret, Julian Duchaine, Naoto Horiguchi, Letian Li, Christoph Mitterbauer (2014), 20th International Conference on Ion Implantation Technology (IIT), 2014. DOI: 10.1109/IIT.2014.6940011.

Cesium/Xenon dual beam sputtering in a Cameca instrument. R. Pureti, B.Douhard, D.Joris, A.Merkulov and W.Vandervorst. Surface and Interface Analysis. Volume 46, Issue S1, pages 25–30, November 2014

Si- useful yields measured in Si, SiC, Si3N4 and SiO2: comparison between the Strong Matter technique and SIMS. B.Kasel and T.Wirtz. Surface and Interface Analysis. Volume 46, Issue S1, pages 39–42, November 2014 

Reduction of the SIMS Matrix Effect Using the Storing Matter Technique: A Case Study on Ti in Different Matrices. B. Kasel and T. Wirtz. Anal. Chem. (2014), 86, 8, 3750–3755. Read full article

Influence of Temperature on Oxidation Mechanisms of Fiber-Textured AlTiTaN Coatings. V. Khetan, N. Valle, D. Duday, C. Michotte, M-P Delplancke-Ogletree, and P. Choquet. ACS Appl. Mater. Interfaces (2014), 6, 6, 4115–4125. Read full article

Homogeneous Surface Oxidation of Organosilicates by Controlled Combustion of Adsorbed Fuels: A Facile Method for Low-Temperature Processing. Bob E. Feller, Vaughn R. Deline, John Bass, André Knoesen, and Robert D. Miller. ACS Appl. Mater. Interfaces (2013), 5, 18, 9075–9087. Read full article

Crystal-Facet-Dependent Metallization in Electrolyte-Gated Rutile TiO2 Single Crystals. T. D. Schladt, T. Graf, N. B. Aetukuri, M. Li, A Fantini, X Jiang, M. G. Samant, and S S. P. Parkin. ACS Nano (2013), 7, 9, 8074–8081. Read full article

Unravelling the secrets of Cs controlled secondary ion formation: Evidence of the dominance of site specific surface chemistry, alloying and ionic bonding. K. Wittmaack. Surface Science Reports. Volumn 68, Issue 1, pages 108–230, 1 March 2013

Ag-Organic Layered Samples for Optoelectronic Applications: Interface Width and Roughening Using a 500 eV Cs+ Probe in Dynamic Secondary Ion Mass Spectrometry. P. Philipp, Quyen K. Ngo, M. Shtein, J. Kieffer, and T. Wirtz. Anal. Chem. 2013, 85, 1, 381–388. Read full article

The secondary ions emission from Si under low-energy Cs bombardment in a presence of oxygen. A. Merkulov. Surface and Interface Analysis. Volume 45, Issue 1, pages 90–92, January 2013

Application of extra-low impact energy SIMS and data reduction algorithm to USJ profiling. D. Kouzminov, A. Merkulov, E. Arevalo, H.-J. Grossmann. Surface and Interface Analysis. Volume 45, Issue 1, pages 345–347, January 2013 

Application of extra-low impact energy SIMS and data reduction algorithm to USJ profiling. D. Kouzminov, A. Merkulov, E. Arevalo, H.-J. Grossmann. Surf. and Interface Analysis, 5 Aug 2012, DOI: 10.1002/sia.5138.

The secondary ions emission from Si under low-energy Cs bombardment in a presence of oxygen. A. Merkulov. Surf. and Interface Analysis, 5 Aug 2012, DOI: 10.1002/sia.5132 

Characteristics of cross-sectional atom probe analysis on semiconductor structures. S.Koelling, N. Innocenti, G.Hellings, M.Gilbert, A.K.Kambham, K. De Meyer, W. Vandervorst. Ultramicroscopy, Volume 111, Issue 6, (May 2011), Pages 540-545. Read full article

Experimental studies of dose retention and activation in fin field-effect-transistor-based structures. Jay Mody, Ray Duffy, Pierre Eyben, Jozefien Goossens, Alain Moussa, Wouter Polspoel, Bart Berghmans, M. J. H. van Dal, B. J. Pawlak, M. Kaiser, R. G. R. Weemaes, and Wilfried Vandervorst (2010), Journal of Vacuum Science & Technology B, Volume 28, Issue 1. C1H5. doi: 10.1116/1.3269755.

Sputtering behavior and evolution of depth resolution upon low energy ion irradiation of GaAs. M.J.P. Hopstaken, M.S. Gordon, D. Pfeiffer, D.K. Sadana, T. Topuria, P.M. Rice, C. Gerl, M. Richter, C. Marchiori. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. Volume 28, Issue 6, 1287, 18 November 2010

Depth profile characterization of ultra shallow junction implants. P. Hönicke, B. Beckhoff, M. Kolbe, D. Giubertoni, J. van den Berg & G. Pepponi. Analytical and Bioanalytical Chemistry volume 396, pages2825–2832(2010). Read full article

Advanced SIMS quantification in the first few nm of B, P, and As Ultra Shallow Implants. A.Merkulov, P.Peres, J.Choi, F.Horreard, H-U.Ehrke, N. Loibl, M.Schuhmacher, Journal of Vacuum Science & Technology B. 28, C1C48 (2010) ; doi:10.1116/1.3225588

Chemical Erosion and Transport: Transport and Deposition of First Wall Impurities. Francesco Ghezzi (2009), CONSIGLIO NAZIONALE DELLE RICERCHE. TASK PWI-08-TA-06. 

Long-term Reproducibility of Relative Sensitivity Factors Obtained with CAMECA Wf. D. Gui, ZX Xing, YH Huang, ZQ Mo, YN Hua, SP Zhao, LZ Cha. Applied Surface Science, Volume 255, Issue 4, Pages 1427–1429 (2008)

EXLE-SIMS: Dramatically Enhanced Accuracy for Dose Loss Metrology. W.Vandervorst, R.Vos, A.J.Salima, A.Merkulov, K. Nakajimac and K.Kimura. Proceedings of the 17th International Conference on Ion Implentation Technology, IIT 2008, Monterey, CA, USA. AIP Conf. Proc. Vol. 1066 (2008), 109-112

Semiconductor profiling with sub-nm resolution: challenges and solutions. W.Vandervorst, App. Surf. Science 255 (2008) 805

Roughness development in the depth profiling with 500eV O2 beam with the combination of oxygen flooding and sample rotation. D. Gui, Z.X.Xing, Y.H.Huang, Z.Q.Mo, Y.N.Hua, S.P.Zhao and L.Z.Cha, App. Surf. Science 255 (2008) 1433

Depth profiling of ultra-thin oxynitride date dielectrics by using MCs2+ technique. D.Gui, Z.X.Xing, Y.H.Huang, Z.Q.Mo, Y.N.Hua, S.P.Zhao and L.Z.Cha (2008), App. Surf. Science, Volume 255, Issue 4, Pages 1437-1439. doi:10.1016/j.apsusc.2008.06.047.

Impurity measurement in silicon with D-SIMS and atom probe tomography. P.Ronsheim, App. Surf. Science 255 (2008) 1547. 

SIMS depth profiling of boron ultra shallow junctions using oblique O2 beam down to 150eV. M.Juhel, F.Laugier, D.Delille,C.Wyon, L.F.T.Kwakman and M.Hopstaken, App. Surf. Science 252 (2006), 7211

Boron ultra low energy SIMS depth profiling improved by rotating stage. M.Bersani, D.Guibertoni, at al, App. Surf. Science 252 (2006) 7315

Comparison between SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants. M.Bersani, D.Guibertoni, et al, App. Surf. Science 252 (2006) 7214

SIMS Depth Profiling of SiGe:C structures in test pattern areas using low energy Cs with a Cameca Wf , M.Juhel, F. Laugier, App. Surf. Science 231-232 (2004) 698

Sputtered depth scales of multi-layered samples with in situ laser interferometry: arsenic diffusion in Si/SiGe layers. P.A.Ronsheim, R.Loesing and A.Mada, App. Surf. Science 231-232 (2004) 762

Short-term and long-term RSF repeatability for CAMECA SC Ultra SIMS measurements. M. Barozzi, D. Giubertoni, M. Anderle and M. Bersani. App. Surf. Science 231-232 (2004) 768-771

Toward accurate in-depth profiling of As and P ultra-shallow implants by SIMS. A. Merkulov, E. de Chambost, M. Schuhmacher and P. Peres. Oral presentation at SIMS XIV, San Diego, USA, Sep. 2003. Applied Surface Science 231–232 (2004) 640–644

Accurate on-line depth calibration with laser interferometer during SIMS profiling experiment on the CAMECA IMS Wf instrument. O. Merkulova, A. Merkulov, M. Schuhmacher, and E. de Chambost. SIMS XIV, San Diego, USA, Sep. 2003. Applied Surface Science 231–232 (2004) 954–958

Latest developments for the CAMECA ULE-SIMS instruments: IMS Wf and SC Ultra. E. de Chambost, A. Merkulov, P. Peres, B. Rasser, M. Schuhmacher. Poster for SIMS XIV, San Diego, USA, Sept 2003. Applied Surface Science 231–232 (2004) 949–953

• Materials
• Geosciences
• Nuclears

• Planetary Sciences
• Geology
• Geochronology
• Paleobiology / Evolution
• Atmospheric particles / Aerosols
• Biomineralization / Paleoclimate
• Environment / Nanoparticles
• Soils
• Plants
• Environmental Microbiology
• Microbiome / Microbiology
• Cell Biology
• Pharmacology / Cosmetics
• Materials
• Methods / Instrumentation

• Planetary Sciences
• Geology
• Geochronology
• Paleobiology / Evolution
• Atmospheric particles / Aerosols
• Biomineralization / Paleoclimate
• Environment / Nanoparticles
• Soils
• Plants
• Environmental Microbiology
• Microbiome / Microbiology
• Cell Biology
• Pharmacology / Cosmetics
• Materials
• Methods / Instrumentation

You are welcome to send us any missing references, pdf and supplements! Please email cameca.info@ametek.com.

Dynamic SIMS for materials analysis in nuclear science. P. Peres, S-Y Choi, F. Desse, P. Bienvenu, I. Roure, Y. Pipon, C. Gaillard, N. Moncoffre, L. Sarrasin, and D. Mangin
Journal of Vacuum Science & Technology B 36, 03F117 (2018); doi: 10.1116/1.5017027

SIMS analysis of irradiated HTR fuel. S. Brémier, M. Laurie, R. Hasnaoui and A. El Abjani (2015), SIMS XX Poster Presentation, Sept. 13-18, 2015.

Evidence of tellurium iodide compounds in apower-ramped irradiated UO2 fuel rod. L. Desgranges, Ch. Riglet-Martial, I. Aubrun, B. Pasquet, I. Roure, J. Lamontagne, T. Blay (2013), Journ al of Nuclear Materia ls, Volume 437, Issue 1-3, Pages 409-414. doi:10.1016/j.jnucmat.2013.02.059.

Measurement of energy spectra on irradiated polycrystalline UO2 samples using secondary ion mass spectrometry. I. Roure, B. Pasquet, L. Desgranges, Ph. Bienvenu (2012), Surface and Interface Analysis, Volume 45, Issue 1, Pages 427-429. DOI: 10.1002/sia.5115.

Microbeam analysis of irradiated nuclear fuel. C T Walker, S Brémier, P Pöml, D Papaioannou, P W D Bottomley (2012), EMAS 2011: 12th European Workshop on Modern Developments in Microbeam Analysis, IOP Conf. Series: Materials Science and Engineering, Volume 32, 012028. doi:10.1088/1757-899X/32/1/012028.

High burnup changes in UO2 fuels irradiated up to 83 GWD/T in M5® claddings. J. Noirot, I. Aubrun, L. Desgranges, K. Hanifi, J. Lamontagne, B. Pasquet, C. Valot, P. Blanpain, H. Cognon (2009), Nuclear Engineering and Technology, Volume 41, No.2, March 2009 – Special Issue on the Water Reactor Fuel Performance Meeting 2008.

SIMS characterisation of actinide isotopes in irradiated nuclear fuel. L. Desgranges, B. Pasquet, Ch. Valot, I. Roure (2009), Journal of Nuclear Materials, Proceedings of a Topical Conference on Plutonium and Actinides: Plutonium Futures - The Science 2008, Volume 385, Issue 1, Pages 99-102. doi:10.1016/j.jnucmat.2008.09.032.

SIMS analysis of an UO2 fuel irradiated at low temperature to 65 MWd/kgHM. C.T. Walker, S. Bremier, S. Portier, R. Hasnaoui, W. Goll (2009). Journal of Nuclear Materials, Volume 393, Issue 2, Pages 212-223. doi:10.1016/j.jnucmat.2009.06.017.

Investigation of the relative sensitivity factor for the quantification of ion microprobe results for Nd isotopes in simulated nuclear fuel. Stéphane Portier, Stéphane Brémier, Rachid Hasnaoui, Olivier Bildstein, Clive T. Walker (2008), Microchimica Acta, Volume 161, Issue 3-4, Pages 479-483. DOI10.1007/s00604-007-0895-8.

A method for the quantification of total xenon concentration in irradiated nuclear fuel with SIMS and EPMA. Lionel Desgranges, Christophe Valot, Bertrand Pasquet, Jérôme Lamontagne, Thierry Blay, Ingrid Roure (2008), Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms, Volume 266, Issue 1, Pages 147-154. doi:10.1016/j.nimb.2007.10.035.

Assessment of the Nd/U ratio for the quantification of neodymium in UO2. L. Desgranges, B. Pasquet, I. Roure, S. Portier, S. Brémier, C.T.Walker, R. Hasnaoui, D. Gavillet, M. Martin, L. Raimbault (2008), Applied Surface Science, Volume 255, Issue 4, Pages 863-865. doi:10.1016/j.apsusc.2008.05.196.

Detailed characterisations of high burn-up structures in oxide fuels. J. Noirot, L. Desgranges, J. Lamontagne (2008), Journal of Nuclear Materials, Volume 372, Issues 2-3, Pages 318-339. doi:10.1016/j.jnucmat.2007.04.037.

Study of structural material resulting from the nuclear fuel cycle using SEM-WDX, EPMA and SIMS techniques. Jérôme Lamontagne, Catherine Eysseric, Lionel Desgranges, Christophe Valot, Jean Noirot, Thierry Blay, Ingrid Roure, Bertrand Pasquet (2008), Microchimica Acta, Volume 161, Issue 3, Pages 355-362. DOI10.1007/s00604-007-0852-6.

SIMS analysis of 83Kr implanted UO2. S. Portier, S. Brémier, R. Hasnaoui, O. Bildstein, C.T. Walker (2008), Applied Surface Science, Volume 255, Issue 4, Pages 1323-1326. doi:10.1016/j.apsusc.2008.05.263.

Secondary ion mass spectrometry of irradiated nuclear fuel and cladding: An overview. S. Portier, S. Brémier, C.T. Walker (2007). International Journal of Mass Spectrometry, Volume 263, Issues 2-3, Pages 113-126. doi:10.1016/j.ijms.2007.01.016.

Fission Gas Bubbles Characterisation in Irradiated UO2 Fuel by SEM, EPMA and SIMS. Jérôme Lamontagne, Lionel Desgranges, Christophe Valot, Jean Noirot, Thierry Blay, Ingrid Roure, Bertrand Pasquet (2006), Microchimica Acta, Volume 155, Pages 183-187. DOI 10.1007/s00604-006-0540-y.

Installation of a Shielded SIMS for the Analysis of Irradiated Nuclear Fuels. Stéphane Brémier, Rachid Hasnaoui, Stéphane Portier, Olivier Bildstein, and Clive T. Walker. (2006), Microchimica Acta, Volume 155, Pages 113-120. DOI 10.1007/s00604-006-0527-8.

A shielded SIMS in CEA : a new tool for the low abundant isotopes characterization. L.Desgranges, B.Pasquet (2005), ATALANTE 2004, P2-17.
Characterisation of irradiated nuclear fuel with SIMS. L. Desgranges, Ch.Valot, B.Pasquet (2005), Applied Surface Science, Volume 252, Issue 19, Pages 7048-7050. doi:10.1016/j.apsusc.2006.02.256.

Detection of Gas Bubble by SIMS in Irradiated Nuclear Fuel. Jérôme Lamontagne, Jean Noirot, Lionel Desgranges, Thierry Blay, Bertrand Pasquet, Ingrid Roure (2004), Microchimica Acta, Volume 145, Issue 1, Pages 91-94. DOI 10.1007/s00604-003-0135-9.

Measurement of xenon in uranium dioxide (UO2) with SIMS. L. Desgranges, B. Pasquet (2004), Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Volume 215, Issues 3-4, Pages 545-551. doi:10.1016/j.nimb.2003.08.033.

A new shielded SIMS instrument for analysis of highly radioactive materials. B. Rasser, L, Desgranges, B. Pasquet (2003), Applied Surface Science, Secondary ion mass spectrometry SIMS XIII, Volume 203-204, Pages 673-678. doi:10.1016/S0169-4332(02)00789-4.

One Year of Operation of the Shielded SIMS with Irradiated Materials in the LECA Facility. L.Desgranges, B.Pasquet (2003), Proceedings of the Plenary Meeting 2003, European Working Group " Hot Laboratories and Remote Handling".

Installation of a shielded SIMS in CEA Cadarache. L. Desgranges, B. Pasquet, B. Rasser (2001).