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APT

Atom Probe Tomography (APT) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, APT has contributed to major advances in materials science.
  • Atom Probe Tomography
    Introduction to APT

    Basic principles for APT sample preparation, data collection, visualization and analysis.

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  • Invizo 6000
    Invizo® 6000

    The 3D Atom Probe with the largest field of view, highest single-specimen yield, greatest analysis volume and most accurate reconstruction, regardless the application.

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  • LEAP 6000
    LEAP 6000 XR™

    First 3D Atom Probe with combined voltage & deep UV laser pulse, the LEAP 6000 XR™ offers improved yield and higher sensitivity for your high throughput application.

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  • LEAP 5000
    LEAP® 5000

    The Atom Probe with 3D unmatched subnanometer analytical performance in metals, oxides, ceramics, semiconductors, bio-minerals and geochemistry.

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  • EIKOS
    EIKOS-UV™

    The Atom Probe that enables routine, high performance 3D nano-analysis for both research and industry.

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