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PRODUCTS
SIMS
Introduction to SIMS
IMS 7f-Auto
IMS 7f-GEO
IMS 1300-HR³ - Large Geometry SIMS
KLEORA
NanoSIMS-HR
NanoSIMS 50L
AKONIS
IMS Wf & SC Ultra
SIMS 4550
ACTINIS - Shielded Ion Microprobe
APT
Introduction to APT
Invizo® 6000
LEAP® 6000 XR
LEAP® 5000
EIKOS-UV™
EPMA
Introduction to EPMA
SKAPHIA
MARKETS
Geosciences
Quantitative analysis of pyroxene (EPMA)
Study of melt inclusions from tephra (EPMA)
Rare Earth Element analyses (SIMS)
Stable isotopes: Carbon (LG-SIMS)
Stable isotopes: Magnesium (LG SIMS)
Geochronology - Confirming the existence of an Ancient ‘lost continent’ (LG-SIMS)
U-Pb geochronology in zircon (LG-SIMS)
Monazite geochronology (EPMA)
Vulcanology: cooling and cold storage in magma (NanoSIMS)
Biogeochemistry: analysis of extracellular biomineralization (NanoSIMS)
Environmental Science
Nuclear safeguards: U isotope analysis (LG-SIMS)
Environmental Microbiology: ecophysiology of anaerobic phototrophic bacteria (NanoSIMS)
Microbial oceanography: quantifying the contribution of microorganisms to C and N cycles (NanoSIMS)
Mining
Invisible Gold in Pyrite (NanoSIMS)
Gold clusters in Arsenopyrite (APT)
Metals
Interdiffusion in Ni-based superalloys (EPMA)
High spatial resolution mapping of precipitates in novel alloys (EPMA)
Detecting trapped hydrogen in aluminum alloy (SIMS)
Oxygen depth profiling in Zn coated steel (SIMS)
Oxidation behavior in zirconium alloys (NanoSIMS)
Grain boundary analysis in metals (APT)
Advanced materials
Small area analysis in Sn-Cu wire structures (SIMS)
Segregation and diffusion in polycrystalline materials (NanoSIMS)
Growth of noble metal nanostructures (NanoSIMS)
Interface analysis in magnetostrictive materials (APT)
Investigation of phase change separation processes (APT)
Energy materials
Dopant monitoring in LED devices (SIMS)
Purity control in PV Si feedstock (SIMS)
Materials for Energy & Catalysis (SIMS)
CIGS thin film solar cells (SIMS)
Nuclear
U and Zr interdiffusion between nuclear fuel and cladding (EPMA)
Helium migration in nuclear reactors (SIMS)
Nuclear glass alteration mechanisms (SIMS)
Semiconductor
Deep and shallow implant depth profiling (SIMS)
Impurity control (SIMS)
Ultra shallow implant metrology (EXLIE SIMS)
Atomic scale characterization of dopants (APT)
Life science
Radiation protection: Uranium diffusion through skin (SIMS)
Cell biology: protein turnover (NanoSIMS)
Cell biology: stem cell division quantification (NanoSIMS)
Biominerals: analysis of impurities in tooth (APT)
SERVICE / SUPPORT
AMECARE
Service Solutions
Training
Upgrades and Accessories
Upgrade kits for IMS 6f and 7f
Upgrade Kits for IMS 1270 / 1280 / 1280-HR
Upgrade kits for NanoSIMS 50 and 50L
Upgrade kits for IMS Wf and SC Ultra
Upgrade Kits for Quad SIMS Series
Upgrade Kits for EPMA (SX100, SXFive, SXFive-TACTIS)
Upgrade Kits for APT (LEAP, EIKOS)
Software
WinCurve
SmartPRO
WinImage II
APM
PeakSight
AP Suite 6
IVAS
Software updates
Relocation Services
Service Visit Evaluation
Get technical support
Customer Satisfaction Survey
LEARNING ZONE
Applications & product literature
SIMS & NanoSIMS
APT
EPMA
Blog
Scientific Publications
SIMS & NanoSIMS
APT
EPMA
Tutorials
Webinars
EPMA
SIMS & NanoSIMS
APT
COMPANY / NEWS
About us
Company Overview
Mission Statement
CAMECA is a business unit of AMETEK, Inc.
News and Events
What's New
Conferences and Trade Shows
2024 Calendar Image Gallery
NanoSIMS Investigation of cisplatin in a mitotic human colon cancer cell
Atom Probe Tomography of metallic glass
NanoSIMS analysis of supersatured nickel-based superalloys
Elemental distribution in a fossil belemnite using EPMA
An asteroid under the NanoSIMS Probe
Investigating the microstructural evolution in uranium-zirconium with APT
Environmental radiological protection application of Dynamic SIMS
EPMA investigation of amphibolite intersected by actinolite/chlorite veins
Studying nanoparticle induced inflammation with NanoSIMS
Atomic-scale microstructure across an α/β interphase interface from a Ti-Fe alloy
Element localization in Dentitruncus truttae using TEM and NanoSIMS
Electron probe microanalysis of phase formation in prototypical corium sample
NanoSIMS reveals subcellular metabolite activity
Fission gas study using shielded EPMA and shielded SIMS
2023 Calendar Image Gallery
Quasicrystal approximant nanoprecipitate in an aluminum alloy
Analysis of a martian meteorite
Reverted austenite and Cu-rich precipitates in trip steels
Vertical-cavity surface-emitting laser
High spatial resolution lithium distribution in aluminum-lithium alloy
Chemical segregation in silicon doped (ALxGA1-x)2O3 at high dopant concentration
Exploring the diversity of the soil minerals
Element distribution (S, F, Zn) in an early miocene shark tooth
Interphase precipitation in microalloyed steel
Plant science: NanoSIMS reveals nitrogen enrichment in maize leaf chloroplasts
Recognizing chemical variations in cork materials via dynamic SIMS
APT of DCT modified Al-Mg-Si AA 6026-T6 alloy
Environmental radiological protection
Corrosion study in two-phase alloy
2022 Calendar Image Gallery
Understanding hydrogen embrittlement in steels
Investigating deep sea mineral deposits
Studying martian meteorites
Inhomogeneous oxidation of silicon carbide
Phase growth in additively manufactured metals
NanoSIMS reveals the symbiotic engine of green hydra
Element distribution in a quinary Ni-Cu-Ti-Zr-Hf alloy
NanoSIMS imaging of uranium nanoparticles in daphnia intestine
Measuring diffusion kinetics on the nanoscale
EPMA analysis of unique amphibole-rich carbonaceous chondrite
Measuring radiation enhanced precipitate evolution
NanoSIMS reveals the effects of cholesterol on cell membranes
Phase inversion in refractory high entropy alloys
NanoSIMS captures interkingdom nitrogen trafficking
Careers
Links
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IMS Wf / SC Ultra
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Atom Probe
CONTACT
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CAMECA Atom Probe Technology Center
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SERVICE / SUPPORT
AMECARE
Service Solutions
Training
Upgrades and Accessories
Upgrade kits for IMS 6f and 7f
Upgrade Kits for IMS 1270 / 1280 / 1280-HR
Upgrade kits for NanoSIMS 50 and 50L
Upgrade kits for IMS Wf and SC Ultra
Upgrade Kits for Quad SIMS Series
Upgrade Kits for EPMA (SX100, SXFive, SXFive-TACTIS)
Upgrade Kits for APT (LEAP, EIKOS)
Software
WinCurve
SmartPRO
WinImage II
APM
PeakSight
AP Suite 6
IVAS
Software updates
Relocation Services
Service Visit Evaluation
Get technical support
Customer Satisfaction Survey
Get technical support
Product specific support contacts for CAMECA instruments
SIMS (IMS series, Quad SIMS, NanoSIMS), EPMA, LEXES, LA-WATAP/FlexTAP:
Phone line: +33 (0)1 43 34 62 37
or follow this link
.
APT (LEAP / EIKOS): wi-mad-leapproduct@ametek.com
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