The scanning ion imaging capabilities of our Dynamic Secondary Ion Mass Spectrometer (D-SIMS) were evaluated on industrial alloys for corrosion studies. These images, with an almost artistic character, allowed us to promote the performance of D-SIMS analyzer to our industrial partners.
Recorded on a CAMECA IMS 7f at GEMaC CNRS/UVSQ Paris-Saclay, France.
Image courtesy of Marie-Amandine Pinault-Thaury and François Jomard.