Among major updates available for the CAMECA SIMS 4550:
Cesium Microbeam Ion Source Upgrade for SIMS 4500 and 4550
forThe Cs source adapted to FLIG provides a denser ion beam and a higher target current. This results in better dynamic range, increased depth profiling speed and better detection limits (especially for vacuum sensitive elements).
Other benefits include:
- Easy maintenance of the gun
- Simple design of the source providing reliability and safety
- Easy and rapid start-up or shut-down of the source higher dynamic range and superior erosion rates
WinCurve: CAMECA SIMS Data Processing Software under PC-Windows Environnement