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Detection
Additional Wavelength Dispersive Spectrometers (for instruments equipped with 3 or 4 vertical spectrometers) or additional WDS crytals (for existing spectrometers)
Increase the analytical range of your instrument with additional spectrometers, equipped with 2 or 4 crystals. Improve detection limits by using a spectrometer with 2 large crystals. Or add different crystals for increased analytical range or optimized element detection.
Energy Dispersive Spectrometer (for instruments equipped with motorized optical zoom)
Detects all elements from B to U in a parallel. Up to 8 EDS channels with « in-situ variable aperture” can be used in addition to WDS in X-ray mapping mode. Use both EDS and WDS calibrations for quantitative analysis.
EDS Hypermap (available for SXFive or SXFiveFE only)
Collect the full EDS spectrum for each pixel and extract your quantitative resuts simultaneously.
Available for SXFive & SXFiveFE only.
Additional BSE low kV detector (available for SXFive or SXFiveFE only)
Achieve superior image quality and identify the area of interest more accurately with the BSE low kV detector (spatial resolution of 15nm or better at 5kV).
Cathodoluminescence detector (for all instruments)
Reveal defects and impurities in materials.
Accessories
Anticontamination system (for all instruments)
Reduces carbon contamination of the sample by a factor of 8.
Airlock-compatible system for transport of sample under vacuum
For air-sensitive samples or radioactive samples
External Point logger
Software
Peak Sight Windows™ software upgrade for the CAMECA SX 100
For SX 100 and SXFive instruments equipped with PC workstations, Peak Sight updates are possible. Check the latest Peak Sight version available at this link.
For an SX 100 equipped with a SUN workstation, the upgrade kit includes a PC computer, Peak Sight software for instrument control and data evaluation, training and manuals. This kit is not compatible with the SUN based EDS system.
Full Remote Control (available for SXFive or SXFiveFE only)
Benefit from a dual interface: “Beginner” with touch-screen tool peration and access to simplified options / “Expert” for skilled users. Ideal to make the most of a single tool at multi-user facilities.
Software modules are available for geology, materials science and metallurgy. Among which:
• STRATAGem-SX: Easily process data for thin film analysis.
• Particles search software: Automatically measure each particle of your sample by exporting its coordinates.
• Geochronology software: Determine a geologically meaningful age by measuring U, Th and Pb using Montel’s formula.
SX Results/PC-Unix: Peak Sight WindowsTM processing software for SX50/100 data acquired with Unix SXRay100/SXN50 software
This PC-based software is the processing part comprised in the Windows™ Peak Sight SX 100 automation, plus an import and conversion module in order to accept data acquired with UNIX-based SX100/50 CAMECA software programs. Data issued from any kind of application (Spectrum, Images, Profile...) are handled in a single window. The program can work as a multi-document interface, allowing several data to be displayed simultaneously. It offers full Copy-Paste capabilities with Microsoft Office™ as well as built-in access to Word™ and Excel™ templates for easy, automated generation of analysis reports.
The following modules are included: WDS Spectra, Images and Line Profile, Quantitative Data, Phase ID, Phase Class, Profile Off Line, Overlay.
Optional modules are available for specific applications:
- option 1: Mapping Quant, Mlayer (multilayer quantification program)
- option 2: Geo Quant (geological quantitative analysis), Geochronology: Age Dating (Includes Mapping Quant) & Age Map (Age Quant)
Don't hesitate to contact your local agent or the CAMECA sales department for more information.